YearAuthorsTitleBibliographicAbstract
2015 Weisskopf, Martin C. Gaskin, Jessica Tananbaum, Harvey EUV and X-ray Optics: Synergy between Laboratory and Space IV
SPIE Proceedings, Vol. 9510 2015SPIE.9510E..02W
2015 Zhao, Ping Transverse x-ray scattering on random rough surfaces
Proceedings of the SPIE, Volume 9510, id. 951009 20 pp. 2015SPIE.9510E..09Z
2015 Arenberg, Jonathan W. They never told me about this in engineering school: lessons from the front line
Proceedings of the SPIE, Volume 9583, id. 958306 11 pp. 2015SPIE.9583E..06A
2014 Schwartz, Daniel A. Invited Review Article: The Chandra X-ray Observatory
Review of Scientific Instruments, Volume 85, Issue 6, id. 061101 2014RScI...85f1101S
2012 Weisskopf, Martin C. Chandra x-ray optics
Optical Engineering, Volume 51, Issue 1, pp. 011013-011013-8 2012OptEn..51a1013W
2012 Weisskopf, Martin C. The Chandra X-Ray Observatory: progress report and highlights
Proceedings of the SPIE, Volume 8443, article id. 84430Y, 9 pp. 2012SPIE.8443E..0YW
2012 Juda, Michael Baski, Mark Eagan, Chris Updating Chandra high-radiation safing in response to changing observatory conditions
Proceedings of the SPIE, Volume 8448, article id. 844805 2012SPIE.8448E..05J
2012 O'Dell, Stephen L. Aldcroft, Thomas L. Atkins, Carolyn Toward active x-ray telescopes II
Proceedings of the SPIE, Volume 8503, article id. 850307, 15 pp. 2012SPIE.8503E..07O
2011 Garmire, Gordon P. The Chandra X-ray observatory
Bulletin of the Astronomical Society of India, Vol. 39, p. 225-241 2011BASI...39..225G
2010 Kashyap, Vinay Posson-Brown, Jennifer Chandra Calibration Review
Chandra Newsletter, Issue 17, p. 34 2010ChNew..17...34K
2010 Matthews, Gary Havey, Keith, Jr. Ten years of Chandra: reflecting back on engineering lessons learned during the design, fabrication, integration, test, and verification of NASA's great x-ray observatory
Proceedings of the SPIE, Volume 7738, id. 77380Y 2010SPIE.7738E..29M
2010 Gorenstein, Paul Focusing X-Ray Optics for Astronomy
X-Ray Optics and Instrumentation, 2010. Special Issue on X-Ray Focusing: Techniques and Applications, id.109740 2010XROI.2010E...2G
2009 David, Larry Chandra Calibration
Chandra Newsletter, Issue 16, p. 19 2009ChNew..16...19D
2006 Smith, Randall K. The Chandra X-ray Observatory: An Astronomical Facility Available to the World
Astrophysics and Space Science, Volume 305, Issue 3, pp. 321-324 2006Ap%26SS.305..321S
2006 Drake, Jeremy J. Ratzlaff, Peter Kashyap, Vinay Monte Carlo processes for including Chandra instrument response uncertainties in parameter estimation studies
Proceedings of the SPIE, Volume 6270, id. 62701I 2006SPIE.6270E..49D
2005 Weisskopf, Martin C. The Chandra X-ray observatory: Five years of observations
COSPAR Information Bulletin, Volume 2005, Issue 162, p. 5-18. 2005CIBu..162....5W
2004 Weisskopf, Martin C. Four years of operation of the Chandra X-Ray Observatory
Proceedings of the SPIE, Volume 5165, pp. 387-401 2004SPIE.5165..387W
2004 Jerius, Diab H. Cohen, Lester Edgar, Richard J. The role of modeling in the calibration of the Chandra's optics
Proceedings of the SPIE, Volume 5165, pp. 402-410 2004SPIE.5165..402J
2004 Gaetz, Terrance J. Edgar, Richard J. Jerius, Diab H. Calibrating the wings of the Chandra PSF
Proceedings of the SPIE, Volume 5165, pp. 411-422 2004SPIE.5165..411G
2004 Allen, Christopher Jerius, Diab H. Gaetz, Terrance J. Parameterization of the Chandra point spread function
Proceedings of the SPIE, Volume 5165, pp. 423-432 2004SPIE.5165..423A
2004 Jerius, Diab H. Gaetz, Terrance J. Karovska, Margarita Calibration of Chandra's near on-axis optical performance
Proceedings of the SPIE, Volume 5165, pp. 433-444 2004SPIE.5165..433J
2004 Beckerman, Eli Aldcroft, Tom Gaetz, Terrance J. Positional accuracy as a measure of Chandra's optical distortions
Proceedings of the SPIE, Volume 5165, pp. 445-456 2004SPIE.5165..445B
2004 Graessle, Dale E. Soufli, Regina Aquila, Andy L. Iridium optical constants for the Chandra X-ray Observatory from reflectance measurements of 0.05-12 keV
Proceedings of the SPIE, Volume 5165, pp. 469-481 2004SPIE.5165..469G
2004 Zhao, Ping Jerius, Diab H. Edgar, Richard J. Chandra X-ray Observatory mirror effective area
Proceedings of the SPIE, Volume 5165, pp. 482-496 2004SPIE.5165..482Z
2004 Spitzbart, Bradley D. Wolk, Scott J. Chandra automated point source processing
Proceedings of the SPIE, Volume 5493, pp. 584-593 2004SPIE.5493..584S
2004 Graessle, Dale E. Soufli, Regina Nelson, Art J. Iridium optical constants from synchrotron reflectance measurements over 0.05- to 12-keV x-ray energies
Proceedings of the SPIE, Volume 5538, p. 72-83 2004SPIE.5538...72G
2003 Weisskopf, M. C. Aldcroft, T. L. Bautz, M. An Overview of the Performance of the Chandra X-ray Observatory
Experimental Astronomy, v. 16, Issue 1, p. 1-68 2003ExA....16....1W
2003 Weisskopf, Martin C. Three years of operation of the Chandra X-ray Observatory
Proceedings of the SPIE, Volume 4851, pp. 1-16 2003SPIE.4851....1W
2003 Mendez, Mariano LETGS: instrument status and science highlights
Proceedings of the SPIE, Volume 4851, pp. 57-68 2003SPIE.4851...57M
2003 Zhao, Ping Van Speybroeck, Leon P. A new method to model x-ray scattering from random rough surfaces
Proceedings of the SPIE, Volume 4851, pp. 124-139 2003SPIE.4851..124Z
2002 Freeman, P. E. Kashyap, V. Rosner, R. A Wavelet-Based Algorithm for the Spatial Analysis of Poisson Data
The Astrophysical Journal Supplement Series, Volume 138, Issue 1, pp. 185-218 2002ApJS..138..185F
2002 Weisskopf, M. C. Brinkman, B. Canizares, C. An Overview of the Performance and Scientific Results from the Chandra X-Ray Observatory
The Publications of the Astronomical Society of the Pacific, Volume 114, Issue 791, pp. 1-24 2002PASP..114....1W
2002 Spitzbart, Brad D. Wolk, Scott J. Isobe, Takashi Chandra monitoring, trends, and response
Proceedings of the SPIE, Volume 4844, pp. 476-484 2002SPIE.4844..476S
2001 Valtchanov, I. Pierre, M. Gastaud, R. Comparison of source detection procedures for {XMM-Newton images
Astronomy and Astrophysics, v.370, p. 689-706 2001A%26A...370..689V
2001 Tananbaum, Harvey Early results from the chandra observatory
AIP Conference Proceedings, Volume 599, pp. 387-395 2001AIPC..599..387T
2001 Tucker, Wallace Tucker, Karen Revealing the universe : the making of the Chandra X-ray Observatory
Revealing the universe : the making of the Chandra X-ray Observatory, Cambridge, MA: Harvard University Press 2001rumc.book.....T
2000 Weisskopf, Martin C. Tananbaum, Harvey D. Van Speybroeck, Leon P. Chandra X-ray Observatory (CXO): overview
Proc. SPIE Vol. 4012, p. 2-16 2000SPIE.4012....2W
2000 Jerius, Diab Donnelly, R. H. Tibbetts, M. S. Orbital measurement and verification of the Chandra X-ray Observatory's PSF
Proc. SPIE Vol. 4012, p. 17-27 2000SPIE.4012...17J
2000 Schwartz, Daniel A. David, Laurence P. Donnelly, R. H. Absolute effective area of the Chandra high-resolution mirror assembly (HRMA)
Proc. SPIE Vol. 4012, p. 28-40 2000SPIE.4012...28S
2000 Gaetz, Terrance J. Jerius, Diab Edgar, Richard J. Orbital verification of the CXO high-resolution mirror assembly alignment and vignetting
Proc. SPIE Vol. 4012, p. 41-52 2000SPIE.4012...41G
2000 Elsner, Ronald F. Kolodziejczak, Jeffery J. O'Dell, Stephen L. Measurements with the Chandra X-ray Observatory's flight contamination monitor
Proc. SPIE Vol. 4012, p. 612-618 2000SPIE.4012..612E
2000 Elsner, Ronald F. Kolodziejczak, Jeffery J. O'Dell, Stephen L. Measurements with the Chandra X-Ray Observatory's flight contamination monitor
Proceedings of the SPIE, Volume 4138, p. 1-9 2000SPIE.4138....1E
2000 Kolodziejczak, Jeffery J. Elsner, Ronald F. Austin, Robert A. Ion transmission to the focal plane of the Chandra X-Ray Observatory
Proc. SPIE Vol. 4140, p. 135-143 2000SPIE.4140..135K
1999 Serej, Shokrollah R. Kellogg, Edwin M. Edgar, Richard J. Absolute calibration of the Chandra X-ray Observatory: transfer standard solid state detectors
Proc. SPIE Vol. 3765, p. 777-788 1999SPIE.3765..777S
1999 Zissa, David E. AXAF-1 high-resolution mirror assembly image model and comparison with x-ray ground-test image
Proc. SPIE Vol. 3766, p. 36-50 1999SPIE.3766...36Z
1998 Olds, Clifford R. Reese, Robert P. Composite structures for the Advanced X-ray Astrophysics Facility (AXAF) Telescope
Proc. SPIE Vol. 3356, p. 910-921 1998SPIE.3356..910O
1998 Barnes, Peter J. McDermott, Walter C. Edgar, Richard J. Towards a solid state detector response function for AXAF calibration
Proc. SPIE Vol. 3356, p. 1046-1056 1998SPIE.3356.1046B
1998 Pendergast, Karl J. Schauwecker, Chris J. Use of a passive reaction wheel jitter isolation system to meet the Advanced X-Ray Astrophysics Facility imaging performance requirements
Proc. SPIE Vol. 3356, p. 1078-1094 1998SPIE.3356.1078P
1998 Havey, Keith A. Compagna, Gary L. Lynch, Nicolle Precision thermal control trades for telescope systems
Proc. SPIE Vol. 3356, p. 1127-1138 1998SPIE.3356.1127H
1998 Moses, Stewart L. Iwens, Ralph P. Grimm, Gary Verification of the performance of large space-based astronomical observatories: AXAF experience and SIM approaches
Proc. SPIE Vol. 3356, p. 1179-1189 1998SPIE.3356.1179M
1998 O'dell, Stephen L. Weisskopf, Martin C. Advanced X-ray Astrophysics Facility (AXAF): calibration overview
Proc. SPIE Vol. 3444, p. 2-18 1998SPIE.3444....2O
1998 Auerhammer, Jutta M. Brandt, G. Scholze, Frank High-accuracy calibration of the HXDS flow-proportional counter for AXAF at the PTB laboratory at BESSY
Proc. SPIE Vol. 3444, p. 19-29 1998SPIE.3444...19A
1998 Stage, Michael D. Dewey, Daniel Verifying the HETG spectrometer Rowland design
Proc. SPIE Vol. 3444, p. 36-47 1998SPIE.3444...36S
1998 Dewey, Daniel Drake, Jeremy J. Edgar, Richard J. AXAF grating efficiency measurements with calibrated nonimaging detectors
Proc. SPIE Vol. 3444, p. 48-63 1998SPIE.3444...48D
1998 Marshall, Herman L. Dewey, Daniel Schulz, Norbert S. Spectral features in the AXAF HETGS effective area using high-signal-continuum tests
Proc. SPIE Vol. 3444, p. 64-75 1998SPIE.3444...64M
1998 Patnaude, Daniel Pease, Deron Donnelly, Hank Effective area of the AXAF high-resolution camera (HRC)
Proc. SPIE Vol. 3444, p. 93-105 1998SPIE.3444...93P
1998 Blake, Richard L. Burek, Anthony J. Fitch, Jonathan J. Feasibility study of ALS beamline 6.3.2 in the calibration of AXAF: initial reflectivity results
Proc. SPIE Vol. 3444, p. 128-139 1998SPIE.3444..128B
1998 Graessle, Dale E. Blake, Richard L. Burek, Anthony J. Modeling of synchrotron reflectance calibrations of AXAF iridium-coated witness mirrors over 2 to 12 keV
Proc. SPIE Vol. 3444, p. 140-159 1998SPIE.3444..140G
1998 Elsner, Ronald F. O'dell, Stephen L. Ramsey, Brian D. Calibration results for the AXAF flight contamination monitor
Proc. SPIE Vol. 3444, p. 177-188 1998SPIE.3444..177E
1998 Swartz, Douglas A. Elsner, Ronald F. Kolodziejczak, Jeffery J. Use of monochromators during AXAF calibration
Proc. SPIE Vol. 3444, p. 189-197 1998SPIE.3444..189S
1998 Allen, Christopher L. Plucinsky, Paul P. McNamara, Brian R. Analysis of the AXAF HRMA+ACIS effective area measurements from the XRCF
Proc. SPIE Vol. 3444, p. 198-209 1998SPIE.3444..198A
1998 Nousek, John A. Townsley, Leisa K. Chartas, George Joint AXAF high-resolution mirror assembly and AXAF CCD Imaging Spectrometer calibration at the MSFC X-Ray Calibration Facility
Proc. SPIE Vol. 3444, p. 225-233 1998SPIE.3444..225N
1998 Zhao, Ping Austin, Robert A. Edgar, Richard J. AXAF-mirror effective area calibration using the C-continuum source and solid state detectors
Proc. SPIE Vol. 3444, p. 234-257 1998SPIE.3444..234Z
1998 Chartas, George Garmire, Gordon P. Nousek, John A. Optimizing the ACIS effective area and energy resolution
Proc. SPIE Vol. 3444, p. 258-266 1998SPIE.3444..258C
1998 Burek, Anthony J. Cobuzzi, J. C. Fitch, Jonathan J. Development of beamline U3A for AXAF synchrotron reflectivity calibrations
Proc. SPIE Vol. 3444, p. 584-597 1998SPIE.3444..584B
1997 Weisskopf, Martin C. O'dell, Stephen L. Calibration of the AXAF observatory: overview
Proc. SPIE Vol. 3113, p. 2-17 1997SPIE.3113....2W
1997 Fitch, Jonathan J. Blake, Richard L. Burek, A. J. AXAF synchrotron witness mirror calibrations 2 to 12 keV
Proc. SPIE Vol. 3113, p. 30-39 1997SPIE.3113...30F
1997 Harris, Bernard Burek, A. J. Fitch, Jonathan J. Determination of optical constants for AXAF mirrors from 0.05 to 1.0 keV through reflectance measurements
Proc. SPIE Vol. 3113, p. 40-51 1997SPIE.3113...40H
1997 Graessle, Dale E. Burek, A. J. Fitch, Jonathan J. Optical constants from synchrotron reflectance measurements of AXAF witness mirrors 2 to 12 keV
Proc. SPIE Vol. 3113, p. 52-64 1997SPIE.3113...52G
1997 Kolodziejczak, Jeffery J. Austin, Robert A. Elsner, Ronald F. Uses of continuum radiation in the AXAF calibration
Proc. SPIE Vol. 3113, p. 65-76 1997SPIE.3113...65K
1997 Gaetz, T. J. Podgorski, William A. Cohen, Lester M. Focus and alignment of the AXAF optics
Proc. SPIE Vol. 3113, p. 77-88 1997SPIE.3113...77G
1997 van Speybroeck, Leon P. Jerius, Diab Edgar, Richard J. Performance expectation versus reality
Proc. SPIE Vol. 3113, p. 89-104 1997SPIE.3113...89V
1997 Zhao, Ping Cohen, Lester M. van Speybroeck, Leon P. AXAF HRMA mirror ring-focus measurements
Proc. SPIE Vol. 3113, p. 106-123 1997SPIE.3113..106Z
1997 Edgar, Richard J. Tsiang, Eugene Y. Tennant, A. F. Spectral fitting in AXAF calibration detectors
Proc. SPIE Vol. 3113, p. 124-131 1997SPIE.3113..124E
1997 Tsiang, Eugene Y. Edgar, Richard J. Vitek, S. A. JMKMOD: a software suite within XSPEC for the ground calibration of AXAF
Proc. SPIE Vol. 3113, p. 132-141 1997SPIE.3113..132T
1997 Powell, Forbes R. Keski-Kuha, Ritva A. Zombeck, Martin V. Metalized polyimide filters for x-ray astronomy and other applications
Proc. SPIE Vol. 3113, p. 432-440 1997SPIE.3113..432P
1997 Kellogg, Edwin M. Cohen, Lester M. Edgar, Richard J. Absolute calibration of the AXAF telescope effective area
Proc. SPIE Vol. 3113, p. 515-525 1997SPIE.3113..515K
1997 Wargelin, Bradford J. Kellogg, Edwin M. McDermott, Walter C. AXAF calibration: the HXDS flow proportional counters
Proc. SPIE Vol. 3113, p. 526-534 1997SPIE.3113..526W
1997 McDermott, Walter C. Kellogg, Edwin M. Wargelin, Bradford J. AXAF HXDS germanium solid state detectors
Proc. SPIE Vol. 3113, p. 535-543 1997SPIE.3113..535M
1997 Kraft, Stefan Scholze, Frank Thornagel, R. High-accuracy calibration of the HXDS HPGe detector at the PTB radiometry laboratory at BESSY
Proc. SPIE Vol. 3114, p. 101-112 1997SPIE.3114..101K
1996 Weisskopf, Martin C. O'dell, Stephen L. van Speybroeck, Leon P. Advanced X-Ray Astrophysics Facility (AXAF)
Proc. SPIE Vol. 2805, p. 2-7 1996SPIE.2805....2W
1996 Romaine, Suzanne E. Bruni, Ricardo J. Clark, Anna M. Monitoring program for the coating of the AXAF flight optics
Proc. SPIE Vol. 2805, p. 8-17 1996SPIE.2805....8R
1996 Graessle, Dale E. Clark, Anna M. Fitch, J. J. Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV
Proc. SPIE Vol. 2805, p. 18-31 1996SPIE.2805...18G
1996 Zissa, David E. Ahmad, Anees Feng, Chen Performance modeling of grazing incidence optics with structural deformations and fabrication errors
Proc. SPIE Vol. 2805, p. 32-43 1996SPIE.2805...32Z
1996 Clark, Anna M. Bruni, Ricardo J. Romaine, Suzanne E. Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples
Proc. SPIE Vol. 2805, p. 268-276 1996SPIE.2805..268C
1996 Bruni, Ricardo J. Clark, Anna M. Moran, J. F. Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samples
Proc. SPIE Vol. 2805, p. 301-310 1996SPIE.2805..301B
1996 Fitch, J. J. Graessle, Dale E. Harris, Bernard Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV
Proc. SPIE Vol. 2805, p. 311-322 1996SPIE.2805..311F
1995 Weisskopf, Martin C. O'Dell, Stephen L. Elsner, Ronald F. Advanced X-ray Astrophysics Facility (AXAF): an overview
Proc. SPIE Vol. 2515, p. 312-329 1995SPIE.2515..312W
1995 Waldman, Mark Alignment test system for AXAF-I's high-resolution mirror assembly
Proceedings of the SPIE, Volume 2515, p. 330-339 1995SPIE.2515..330W
1995 Lewis, Timothy S. AXAF-I alignment test system autocollimating flat error correction
Proceedings of the SPIE, Volume 2515, p. 340-351 1995SPIE.2515..340L
1995 Glenn, Paul E. Centroid detector assembly for the AXAF-I alignment test system
Proc. SPIE Vol. 2515, p. 352-360 1995SPIE.2515..352G
1995 Reid, Paul B. Fabrication and predicted performance of the Advanced X-ray Astrophysics Facility mirror ensemble
Proc. SPIE Vol. 2515, p. 361-374 1995SPIE.2515..361R
1995 Cohen, Lester M. Effects of temporal dimensional instability on the Advanced X-ray Astrophysics Facility (AXAF-I) high-resolution mirror assembly (HRMA)
Proc. SPIE Vol. 2515, p. 375-390 1995SPIE.2515..375C
1995 Zhao, Ping van Speybroeck, Leon P. AXAF VETA-I mirror x-ray test results cross-check with the HDOS metrology data
Proc. SPIE Vol. 2515, p. 391-409 1995SPIE.2515..391Z
1995 Sulkanen, Martin E. Kolodziejczak, Jeffery J. Chartas, George Numerical simulation of electron-impact x-ray sources
Proc. SPIE Vol. 2515, p. 410-415 1995SPIE.2515..410S
1995 Kellogg, Edwin M. Wargelin, Bradford J. Norton, Timothy J. Penning source for calibration of x-ray and EUV optics and spectrometers at wavelengths as short as 50 A
Proc. SPIE Vol. 2515, p. 418-419 1995SPIE.2515..418K
1995 Kolodziejczak, Jeffery J. Austin, Robert A. Elsner, Ronald F. X-ray source system at the Marshall Space Flight Center X-ray calibration facility
Proc. SPIE Vol. 2515, p. 420-435 1995SPIE.2515..420K
1995 Tsiang, Eugene Y. Kellogg, Edwin M. Porterfield, Don FIB 601 focused ion beam fabrication of micron-sized apertures for the NASA AXAF x-ray telescope prelaunch calibration
Proc. SPIE Vol. 2640, p. 100-110 1995SPIE.2640..100T
1994 Zhao, Ping Freeman, Mark D. Jerius, Diab AXAF VETA-I mirror ring focus measurements
Proc. SPIE Vol. 2011, p. 59-74 1994SPIE.2011...59Z
1994 Campbell, Jonathan W. Hoover, Richard B. Baker, Phillip C. Performance of the repolished S-056 grazing incidence mirror in the MSFC AXAF test facility
Proc. SPIE Vol. 2011, p. 75-88 1994SPIE.2011...75C
1994 Gordon, Thomas E. Catching, Benjamin F. Status of the Advanced X-Ray Astrophysics Facility (AXAF) optics production program
Proc. SPIE Vol. 2263, p. 233-242 1994SPIE.2263..233G
1994 Cerino, Joseph R. Lewotsky, Kristin L. Bourgeois, Robert P. High-precision mechanical profilometer for grazing incidence optics
Proc. SPIE Vol. 2263, p. 253-262 1994SPIE.2263..253C
1994 Graessle, Dale E. Burbine, T. H. Fitch, J. J. Molecular contamination study of iridium-coated x-ray mirrors
Proc. SPIE Vol. 2279, p. 12-26 1994SPIE.2279...12G
1993 Weisskopf, Martin C. The AXAF VETA test - an overview
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 2-5. 1993SPIE.1742....2W
1993 Elsner, R. F. O'dell, S. L. Weisskopf, M. C. Molecular contamination and the calibration of AXAF
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 6-12 1993SPIE.1742....6E
1993 Waldman, Mark Texter, Scott Alignment of the AXAF Verification Test Article-I (VETA)
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 13-25 1993SPIE.1742...13W
1993 Zhao, Ping Kellogg, Edwin M. Schwartz, Daniel A. Intensity distribution of the X-ray source for the AXAF VETA-I mirror test
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 26-39 1993SPIE.1742...26Z
1993 Podgorski, W. A. Flanagan, K. A. Freeman, M. D. VETA-I X-ray Detection System
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 40-54 1993SPIE.1742...40P
1993 Brissenden, Roger J. V. Jones, Mark T. Ljungberg, Malin VETA X-ray Data Acquisition and Control System
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 55-64 1993SPIE.1742...55B
1993 Chartas, G. Flanagan, K. Hughes, J. P. Correcting X-ray spectra obtained from the AXAF VETA-I mirror calibration for pileup, continuum, background and deadtime
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 65-74 1993SPIE.1742...65C
1993 Zhao, Ping Freeman, Mark D. Hughes, John P. AXAF VETA-I mirror encircled energy measurements and data reduction
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 75-90 1993SPIE.1742...75Z
1993 Zissa, David E. Comparison of ring-focus image profile with predictions for the AXAF VETA-I test
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 91-103 1993SPIE.1742...91Z
1993 Arenberg, Jonathan W. Texter, Scott C. A motion detection system for AXAF X-ray ground testing
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 104-113 1993SPIE.1742..104A
1993 Schwartz, D. A. Chartas, G. Hughes, J. P. Precision of the calibration of the AXAF Engineering Test Article (VETA) mirrors
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 116-135 1993SPIE.1742..116S
1993 Freeman, M. Hughes, J. van Speybroeck, L. Image analysis of the AXAF VETA-1 X-ray mirror
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 136-151 1993SPIE.1742..136F
1993 Hughes, John P. Schwartz, Daniel Szentgyorgyi, Andrew Surface finish quality of the outer AXAF mirror pair based on X-ray measurements of the VETA-I
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 152-161 1993SPIE.1742..152H
1993 Kolodziejeczak, J. J. O'dell, S. L. Elsner, R. F. Evidence for dust contamination on the VETA-1 mirror surface
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 162-170 1993SPIE.1742..162K
1993 O'dell, S. L. Elsner, R. F. Kolodziejeczak, J. J. X-ray evidence for particulate contamination on the AXAF VETA-1 mirrors
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 171-182 1993SPIE.1742..171O
1993 Kellogg, E. Chartas, G. Graessle, D. The X-ray reflectivity of the AXAF VETA-I optics
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 183-190 1993SPIE.1742..183K
1993 Matthews, Gary Buettner, Arthur Casey, Thomas M. Mirror cell design, fabrication, assembly, and test for the AXAF VETA-I optics
Proc. SPIE Vol. 1742, p. 191-202 1993SPIE.1742..191M
1993 Graessle, D. E. Burbine, T. H. Cobuzzi, J. C. Reflectance calibrations of AXAF mirror samples at absorption edges using synchrotron radiation
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 203-218 1993SPIE.1742..203G
1993 Blake, R. L. Davis, J. C. Burbine, T. H. Optical constants from mirror reflectivities measured at synchrotrons
Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, p. 219-222 1993SPIE.1742..219B
1993 Winkler, Carl E. Cumings, Nesbitt P. Randolph, Joseph L. Science instruments for the Advanced X-Ray Astrophysics Facility (AXAF)
Proc. SPIE Vol. 1948, p. 63-74 1993SPIE.1948...63W
1993 Morian, Hans F. Knapp, Konrad Hartmann, Peter Quality-assurance demands and realization for thin-walled mirror blanks made of ZERODUR for the AXAF project
Proc. SPIE Vol. 1993, p. 6-17 1993SPIE.1993....6M
1993 Patterson, John S. Chisholm, Kevin P. Gordon, Thomas E. AXAF optical quality ensurance via the crosscheck process
Proc. SPIE Vol. 1993, p. 18-22 1993SPIE.1993...18P
1992 Sarnik, Andrea Zimmerman, Gerry Integrated end-to-end metrology and data analysis system for the advanced x-ray astrophysics facility telescope mirrors
Proc. SPIE Vol. 1531, p. 2-19 1992SPIE.1531....2S
1992 Convertito, Peter M. Cerino, Joseph R. Dunn, Daniel E. Polarization compensation during circumferential metrology of advanced x-ray astrophysical facility optics
Proc. SPIE Vol. 1531, p. 223-231 1992SPIE.1531..223C
1992 Kellogg, E. Brissenden, R. Flanagan, K. Calibration of the Verification Engineering Test Article-I (VETA-I) for AXAF using the VETA-I X-ray Detection System
Multilayer and grazing incidence X-ray/EUV optics; Proceedings of the Meeting, San Diego, CA, p. 2-12. 1992SPIE.1546....2K
1992 Graessle, D. E. Brissenden, R. J. Cobuzzi, J. Feasibility study of the use of synchrotron radiation in the calibration of AXAF - Initial reflectivity results
Multilayer and grazing incidence X-ray/EUV optics; Proceedings of the Meeting, San Diego, CA, p. 13-25 1992SPIE.1546...13G
1992 Slane, P. Schwartz, D. van Speybroeck, L. Grazing incidence X-ray reflectivity - Studies for the AXAF observatory
Multilayer and grazing incidence X-ray/EUV optics; Proceedings of the Meeting, San Diego, CA, p. 26-40 1992SPIE.1546...26S
1992 Matthews, Gary Buettner, Arthur Casey, Thomas Mirror cell design, fabrication, assembly, and test for the AXAF VETA-I optics
Design of optical instruments; Proceedings of the Meeting, Orlando, FL, p. 345-356. 1992SPIE.1690..345M
1991 Flanagan, K. Austin, G. K. Cobuzzi, J. P. Uniformity and transmission of proportional counter window materials for use with AXAF
EUV, X-ray, and gamma-ray instrumentation for astronomy II; Proceedings of the Meeting, San Diego, CA, p. 395-407 1991SPIE.1549..395F
1990 Casey, Thomas M. Steele, Jeffrey M. Brearey, Robert R. A ray tracing technique incorporating finite element analysis for grazing incidence optics
Advances in optical structure systems; Proceedings of the Meeting, Orlando, FL, p. 34-47 1990SPIE.1303...34C
1990 Cohen, Lester M. Cernoch, Lawrence J. Matthews, Gary Structural considerations for fabrication and mounting of the AXAF HRMA optics
Proc. SPIE Vol. 1303, p. 162-177 1990SPIE.1303..162C
1990 Mehta, Pravin K. Pressure distribution under flexible polishing tools. II - Cylindrical (conical) optics
Advances in optical structure systems; Proceedings of the Meeting, Orlando, FL, p. 189-205 1990SPIE.1303..189M
1990 Brown, Daniel M. Chipman, Russell A. Polarization analysis of the Advanced X-ray Astrophysical Facility telescope assembly
Polarimetry: Radar, infrared, visible, ultraviolet, and X-ray; Proceedings of the Meeting, Huntsville, AL, p. 395-412 1990SPIE.1317..395B
1990 Darnton, Lane A. Champetier, Robert J. Blanco, Julio R. Ultrasensitive dust monitor for the Advanced X-ray Astrophysics Facility (AXAF)
Optical system contamination: Effects, measurement, control II; Proceedings of the Meeting, San Diego, CA, p. 211-220 1990SPIE.1329..211D
1990 Gordon, Thomas E. Circumferential and inner diameter metrology for the Advanced X-ray Astrophysical Facility (AXAF) optics
Advanced optical manufacturing and testing; Proceedings of the Meeting, San Diego, CA, p. 239-247 1990SPIE.1333..239G
1990 Cernoch, Larry Structural error sources during fabrication of the AXAF optical elements
Advanced optical manufacturing and testing; Proceedings of the Meeting, San Diego, CA, p. 303-313 1990SPIE.1333..303C
1990 Sheng, Simon C. Berendsohn, Oscar Schreibman, Martin R. Correlation of RTV properties to test data and its effect on the AXAF mirror performance
Proceedings of the SPIE, Volume 1333, p. 314-324 1990SPIE.1333..314S
1990 Cernoch, Lawrence J. Cheney, George Vasisko, Carolyn H. AXAF precision metrology mount
Proceedings of the SPIE, Volume 1333, p. 374-385 1990SPIE.1333..374C